Balancing test cost reduction vs. measurements accuracy at test time
| Title: | Balancing test cost reduction vs. measurements accuracy at test time |
|---|---|
| Authors: | Verdy, Matthieu; Morche, Dominique; De Foucauld, Emeric; Lesecq, Suzanne; Mallet, Jean-Pascal; Mayor, Cedric |
| Source: | 2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) New Circuits and Systems Conference (NEWCAS), 2015 IEEE 13th International. :1-4 Jun, 2015 |
| Relation: | 2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS) |
| Database: | IEEE Xplore Digital Library |