Thermal issues in test: An overview of the significant aspects and industrial practice
| Title: | Thermal issues in test: An overview of the significant aspects and industrial practice |
|---|---|
| Authors: | Alt, J.; Bernardi, P.; Bosio, A.; Cantoro, R.; Kerkhoff, H.; Leininger, A.; Molzer, W.; Motta, A.; Pacha, C.; Pagani, A.; Rohani, A.; Strasser, R. |
| Source: | 2016 IEEE 34th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2016 IEEE 34th. :1-4 Apr, 2016 |
| Relation: | 2016 IEEE 34th VLSI Test Symposium (VTS) |
| Database: | IEEE Xplore Digital Library |