| Title: |
Synchrotron X-ray diffraction in air and vacuum: Strain and structure at the nano-scale |
| Authors: |
Burrows, Christopher; Hase, Thomas; Aldous, James; Hatfield, Stuart; Ashwin, Mark; Bell, Gavin |
| Source: |
2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS), 2016. :1-1 Jun, 2016 |
| Relation: |
2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)] |
| Database: |
IEEE Xplore Digital Library |