Multipactor threshold sensitivity to Total Electron Emission Yield in parallel-plate waveguide and TEEY models accuracy
| Title: | Multipactor threshold sensitivity to Total Electron Emission Yield in parallel-plate waveguide and TEEY models accuracy |
|---|---|
| Authors: | Fil, N.; Belhaj, M.; Hillairet, J.; Puech, J. |
| Source: | 2016 IEEE MTT-S International Microwave Symposium (IMS) Microwave Symposium (IMS), 2016 IEEE MTT-S International. :1-4 May, 2016 |
| Relation: | 2016 IEEE/MTT-S International Microwave Symposium - MTT 2016 |
| Database: | IEEE Xplore Digital Library |