Analysis of ESD effects on organic thin-film-transistors by means of TLP technique
| Title: | Analysis of ESD effects on organic thin-film-transistors by means of TLP technique |
|---|---|
| Authors: | Wrachien, N.; Barbato, M.; Cester, A.; Rizzo, A.; Meneghesso, G.; D'Alpaos, R.; Turatti, G.; Generali, G.; Muccini, M. |
| Source: | 2016 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2016 IEEE International. :EL-6-1-EL-6-5 Apr, 2016 |
| Relation: | 2016 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |