REDO-random excitation and deterministic observation-first commercial experiment
| Title: | REDO-random excitation and deterministic observation-first commercial experiment |
|---|---|
| Authors: | Grimaila, M.R.; Sooryong Lee; Dworak, J.; Butler, K.M.; Stewart, B.; Balachandran, H.; Houchins, B.; Mathur, V.; Jaehong Park; Wang, L.-C.; Mercer, M.R. |
| Source: | Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) VLSI test symposium VLSI Test Symposium, 1999. Proceedings. 17th IEEE. :268-274 1999 |
| Relation: | Proceedings 17th IEEE VLSI Test Symposium |
| Database: | IEEE Xplore Digital Library |