Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry
| Title: | Surface Layer Analysis of a 28Si-Enriched Sphere Both in Vacuum and in Air by Ellipsometry |
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| Authors: | Fujita, K.; Kuramoto, N.; Azuma, Y.; Mizushima, S.; Fujii, K. |
| Source: | IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 66(6):1283-1288 Jun, 2017 |
| Database: | IEEE Xplore Digital Library |