Statistical outlier screening as a test solution health monitor
| Title: | Statistical outlier screening as a test solution health monitor |
|---|---|
| Authors: | Shaw, David; Hoops, Dirk; Butler, Kenneth M.; Nahar, Amit |
| Source: | 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-10 Nov, 2016 |
| Relation: | 2016 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |