What we know after twelve years developing and deploying test data analytics solutions
| Title: | What we know after twelve years developing and deploying test data analytics solutions |
|---|---|
| Authors: | Butler, Kenneth M.; Nahar, Amit; Daasch, W. Robert |
| Source: | 2016 IEEE International Test Conference (ITC) Test Conference (ITC), 2016 IEEE International. :1-8 Nov, 2016 |
| Relation: | 2016 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |