| Title: |
Accurate Diagnosis of Interconnect Open Defects Based on the Robust Enhanced Aggressor Victim Model |
| Authors: |
Raiola, Pascal; Erb, Dominik; Reddy, Sudhakar M.; Becker, Bernd |
| Source: |
2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID), 2017 30th International Conference on. :135-140 Jan, 2017 |
| Relation: |
2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) |
| Database: |
IEEE Xplore Digital Library |