| Title: |
Influence of passivation anneal position on metal coverage dependent mismatch and hot carrier reliability |
| Authors: |
Chetlur, S.; Sen, S.; Harris, E.; Vaidya, H.; Kizilyalli, I.; Gregor, R.; Harding, B. |
| Source: |
Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 1999. Proceedings of the 1999 7th International Symposium on the. :21-24 1999 |
| Relation: |
Proceedings of 7th International Symposium on Physical and Failure Analysis of Integrated Circuits |
| Database: |
IEEE Xplore Digital Library |