| Title: |
An effective fault-injection framework for memory reliability enhancement perspectives |
| Authors: |
Harcha, G.; Bosio, A.; Girard, P.; Virazel, A.; Bernardi, P. |
| Source: |
2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2017 12th International Conference on. :1-6 Apr, 2017 |
| Relation: |
2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) |
| Database: |
IEEE Xplore Digital Library |