| Title: |
Compact modeling of intrinsic capacitances in Double-Gate Tunnel-FETs |
| Authors: |
Farokhnejad, A.; Graef, M.; Horst, F.; Liu, C.; Zhao, Q.T.; Iniguez, B.; Lime, F.; Kloes, A. |
| Source: |
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2017 Joint International EUROSOI Workshop and International Conference on. :140-143 Apr, 2017 |
| Relation: |
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) |
| Database: |
IEEE Xplore Digital Library |