| Title: |
Effects of temperature and supply voltage on SEU- and SET-induced single-event errors in bulk 40-nm sequential circuits |
| Authors: |
Chen, R. M.; Diggins, Z. J.; Mahatme, N. N.; Wang, L.; Zhang, E. X.; Chen, Y. P.; Liu, Y. N.; Narasimham, B.; Witulski, A. F.; Bhuva, B. L.; Fleetwood, D. M. |
| Source: |
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2016 16th European Conference on. :1-4 Sep, 2016 |
| Relation: |
2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| Database: |
IEEE Xplore Digital Library |