Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits
| Title: | Practical application of automated fault diagnosis for stuck-at, bridging, and measurement condition dependent faults in fully scanned sequential circuits |
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| Authors: | Shimoda, R.; Yoshida, T.; Watari, M.; Toyota, Y.; Nishi, K.; Motohara, A. |
| Source: | Proceedings Eighth Asian Test Symposium (ATS'99) Asian test symposium Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian. :347-353 1999 |
| Relation: | Proceedings of the Eighth Asian Test Symposium |
| Database: | IEEE Xplore Digital Library |