A soft measurement of small out-line transistor in surface mount technology
| Title: | A soft measurement of small out-line transistor in surface mount technology |
|---|---|
| Authors: | Xu, Chao; Bai, Lifei; Zhang, Zhihao; Han, Boxuan |
| Source: | IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society Industrial Electronics Society , IECON 2017 - 43rd Annual Conference of the IEEE. :6855-6858 Oct, 2017 |
| Relation: | IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society |
| Database: | IEEE Xplore Digital Library |