Tools for non-invasive optical characterization of CMOS circuits
| Title: | Tools for non-invasive optical characterization of CMOS circuits |
|---|---|
| Authors: | Stellari, F.; Zappa, F.; Cova, S.; Vendrame, L. |
| Source: | International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :487-490 1999 |
| Relation: | International Electron Devices Meeting 1999. Technical Digest |
| Database: | IEEE Xplore Digital Library |