Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter
| Title: | Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter |
|---|---|
| Authors: | Xu, Li; Zhuang, Yuming; Thinakaran, Rajavelu; Butler, Kenneth M.; Chen, Degang |
| Source: | 2017 IEEE International Test Conference (ITC) Test Conference (ITC), 2017 IEEE International. :1-10 Oct, 2017 |
| Relation: | 2017 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |