| Title: |
Solving the BEOL compatibility challenge of top-pinned magnetic tunnel junction stacks |
| Authors: |
Swerts, J.; Liu, E.; Couet, S.; Mertens, S.; Rao, S.; Kim, W.; Garello, K.; Souriau, L.; Kundu, S.; Crotti, D.; Yasin, F.; Jossart, N.; Sakhare, S.; Devolder, T.; Van Beek, S.; O'Sullivan, B.; Van Elshocht, S.; Furnemont, A.; Kar, G. S. |
| Source: |
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :38.6.1-38.6.4 Dec, 2017 |
| Relation: |
2017 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |