| Title: |
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown |
| Authors: |
O'Sullivan, B J; Van Beek, S; Roussel, Ph. J.; Rao, S.; Kim, W.; Couet, S.; Swerts, J.; Yasin, F.; Crotti, D.; Linten, D.; Kar, G. |
| Source: |
2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-MY.5-1-P-MY.5-6 Mar, 2018 |
| Relation: |
2018 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |