Back-bias generator for post-fabrication threshold voltage tuning applications in 22nm FD-SOI process
| Title: | Back-bias generator for post-fabrication threshold voltage tuning applications in 22nm FD-SOI process |
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| Authors: | Siddiqi, Arif; Jain, Navneet; Rashed, Mahbub |
| Source: | 2018 19th International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2018 19th International Symposium on. :268-273 Mar, 2018 |
| Relation: | 2018 19th International Symposium on Quality Electronic Design (ISQED) |
| Database: | IEEE Xplore Digital Library |