Efficient generation of parametric test conditions for AMS chips with an interval constraint solver
| Title: | Efficient generation of parametric test conditions for AMS chips with an interval constraint solver |
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| Authors: | Neubauer, Felix; Burchard, Jan; Raiola, Pascal; Rivoir, Jochen; Becker, Bernd; Sauer, Matthias |
| Source: | 2018 IEEE 36th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2018 IEEE 36th. :1-6 Apr, 2018 |
| Relation: | 2018 IEEE 36th VLSI Test Symposium (VTS) |
| Database: | IEEE Xplore Digital Library |