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Patterning challenges for monolithic silicon photonics: AP/DFM: Advanced patterning / design for manufacturability

Title: Patterning challenges for monolithic silicon photonics: AP/DFM: Advanced patterning / design for manufacturability
Authors: Meagher, Colleen; Sowinski, Zoey; Yu, Chienfan; Hu, Shuren; Nummy, Karen; Ghosal, Mini Modh; Viswanathan, Ramya; Abdo, Amr; Wiltshire, Tim
Source: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual. :155-158 Apr, 2018
Relation: 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
Database: IEEE Xplore Digital Library