Utilization of waveform measurements for degradation analysis of AlGaN/GaN HFETs
| Title: | Utilization of waveform measurements for degradation analysis of AlGaN/GaN HFETs |
|---|---|
| Authors: | Roff, Chris; Bennedikt, J.; Tasker, Paul J.; Wallis, D.J.; Hilton, K.P.; Maclean, J.O.; Hayes, D.G.; Uren, M. J.; Martin, T. |
| Source: | 2007 70th ARFTG Microwave Measurement Conference (ARFTG) ARFTG Microwave Measurement Conference (ARFTG), 2007 70th. :1-4 Nov, 2007 |
| Relation: | 2007 70th ARFTG Conference (ARFTG) |
| Database: | IEEE Xplore Digital Library |