A low-speed BIST framework for high-performance circuit testing
| Title: | A low-speed BIST framework for high-performance circuit testing |
|---|---|
| Authors: | Speek, H.; Kerkhoff, H.G.; Shashaani, M.; Sachdev, M. |
| Source: | Proceedings 18th IEEE VLSI Test Symposium VLSI test symposium VLSI Test Symposium, 2000. Proceedings. 18th IEEE. :349-355 2000 |
| Relation: | Proceedings 18th IEEE VLSI Test Symposium |
| Database: | IEEE Xplore Digital Library |