| Title: |
Prediction of Electrical and Physical Failure Analysis Success Using Artificial Neural Networks |
| Authors: |
Zhao, Lin; Goh, SH; Chan, YH; Yeoh, BL; Hu, Hao; Thor, MH; Tan, Alan; Lam, Jeffrey |
| Source: |
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-5 Jul, 2018 |
| Relation: |
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| Database: |
IEEE Xplore Digital Library |