Low temperature analysis of 0.25 /spl mu/m T-gate strained Si/Si/sub 0.55/Ge/sub 0.45/ n-MODFET's
| Title: | Low temperature analysis of 0.25 /spl mu/m T-gate strained Si/Si/sub 0.55/Ge/sub 0.45/ n-MODFET's |
|---|---|
| Authors: | Aniel, F.; Zerounian, N.; Adde, R.; Zeuner, M.; Hackbarth, T.; Konig, U. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 47(7):1477-1483 Jul, 2000 |
| Database: | IEEE Xplore Digital Library |