| Title: |
Process Monitoring with High-Resolution CZT |
| Authors: |
Wahl, Christopher G.; Kaye, Willy; Zhang, Feng; Boucher, Y. Andy; Jaworski, Jason; Moran, Kevin; Matthews, Thurston; Tefft, David; Yang, Hao; Wang, Weiyi; Kitchen, Brian; Ulrich, Molly; Slatina, Timothy; Brown, Steven; He, Zhong |
| Source: |
2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2017 IEEE. :1-5 Oct, 2017 |
| Relation: |
2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) |
| Database: |
IEEE Xplore Digital Library |