| Title: |
Comparison of Line Scan Luminescence Imaging Techniques for Defect Characterisation in Crystalline Silicon Solar Modules |
| Authors: |
Zafirovska, Iskra; Juhl, Mattias K.; Trupke, Thorsten |
| Source: |
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) Photovoltaic Energy Conversion (WCPEC), 2018 IEEE 7th World Conference on. :1364-1369 Jun, 2018 |
| Relation: |
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) |
| Database: |
IEEE Xplore Digital Library |