| Title: |
Breakthroughs in 3D Sequential technology |
| Authors: |
Brunet, L.; Fenouillet-Beranger, C.; Batude, P.; Beaurepaire, S.; Ponthenier, F.; Rambal, N.; Mazzocchi, V.; Pin, J-B.; Acosta-Alba, P.; Kerdiles, S.; Besson, P.; Fontaine, H.; Lardin, T.; Fournel, F.; Larrey, V.; Mazen, F.; Balan, V.; Morales, C.; Guerin, C.; Jousseaume, V.; Federspiel, X.; Ney, D.; Garros, X.; Roman, A.; Scevola, D.; Perreau, P.; Kouemeni-Tchouake, F.; Arnaud, L.; Scibetta, C.; Chevalliez, S.; Aussenac, F.; Aubin, J.; Reboh, S.; Andrieu, F.; Maitrejean, S.; Vinet, M. |
| Source: |
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :7.2.1-7.2.4 Dec, 2018 |
| Relation: |
2018 IEEE International Electron Devices Meeting (IEDM) |
| Database: |
IEEE Xplore Digital Library |