Modeling the Interface Trap Density Influence on Junctionless Nanowire Transistors Behavior
| Title: | Modeling the Interface Trap Density Influence on Junctionless Nanowire Transistors Behavior |
|---|---|
| Authors: | Trevisoli, R.; Doria, R. T.; de Souza, M.; Pavanello, M. A. |
| Source: | 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE. :1-3 Oct, 2018 |
| Relation: | 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) |
| Database: | IEEE Xplore Digital Library |