| Title: |
Radiation Hardness Studies on a Novel CMOS Process for Depleted Monolithic Active Pixel Sensors |
| Authors: |
Schioppa, Enrico Junior; Bates, Richard; Buttar, Craig; Dalla, Marco; Van Hoorne, Jacobus Willem; Kugathasan, Thanushan; Maneuski, Dzmitry; Tobon, Cesar Augusto Marin; Musa, Luciano; Pernegger, Heinz; Riedler, Petra; Riegel, Christian; Sbarra, Carla; Schaefer, Douglas Michael; Sharma, Abhishek; Snoeys, Walter; Sanchez, Carlos Solans |
| Source: |
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2017 17th European Conference on. :1-7 Oct, 2017 |
| Relation: |
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| Database: |
IEEE Xplore Digital Library |