| Title: |
Dynamic SEE Testing of Selected Architectural Features of Xilinx 28 nm Virtex-7 FPGAs |
| Authors: |
Swift, Gary M.; Stone, Stephen E.; Garcia, Sebastian E.; Wray, Kevin W.; Rowe, William J.; Pfau, Krysten H.; Liu, Robert; Holden, Jonathan; Angeles, Asa; Willits, Barry L.; Robinson, Kyle P.; Perez-Celis, Andres; Wirthlin, Michael J. |
| Source: |
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2017 17th European Conference on. :1-6 Oct, 2017 |
| Relation: |
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| Database: |
IEEE Xplore Digital Library |