Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect
| Title: | Analyzing Radiation-Induced Transient Errors on SRAM-Based FPGAs by Propagation of Broadening Effect |
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| Authors: | De Sio, C.; Azimi, S.; Sterpone, L.; Du, B. |
| Source: | IEEE Access Access, IEEE. 7:140182-140189 2019 |
| Database: | IEEE Xplore Digital Library |