| Title: |
Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability |
| Authors: |
Stoffels, S.; Posthuma, N.; Decoutere, S.; Bakeroot, B.; Tallarico, A.N.; Sangiorgi, Enrico; Fiegna, Claudio; Zheng, J.; Ma, X.; Borga, M.; Fabris, Elena; Meneghini, M.; Zanoni, E.; Meneghesso, G.; Priesol, J.; Satka, A. |
| Source: |
2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-10 Mar, 2019 |
| Relation: |
2019 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |