| Title: |
Probing impact on pad moisture tightness: A challenge for pad size reduction |
| Authors: |
Vidal-Dho, Matthias; Hubert, Quentin; Gonon, Patrice; Delorme, Philippe; Jacquot, Jonathan; Marchetti, Maxime; Beauvisage, Ludovic; Moragues, Jean-Michel; Potard, Pascale; Fornara, Pascal; Escales, Jean-Philippe; Sallagoity, Pascal; Pizzuto, Olivier; Maury, Delphine; Mirabel, Jean-Michel |
| Source: |
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :176-179 Mar, 2019 |
| Relation: |
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |