A 30 ns 16 Mb 2 b/cell Embedded Flash with Ramped Gate Time-Domain Sensing Scheme for Automotive Application
| Title: | A 30 ns 16 Mb 2 b/cell Embedded Flash with Ramped Gate Time-Domain Sensing Scheme for Automotive Application |
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| Authors: | Kiesel, Sebastian; Kern, Thomas; Wicht, Bernhard; Graeb, Helmut |
| Source: | 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2019 International Symposium on. :1-4 Apr, 2019 |
| Relation: | 2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) |
| Database: | IEEE Xplore Digital Library |