| Title: |
Rebooting Computing: The Challenges for Test and Reliability |
| Authors: |
Bosio, A.; O'Connor, I.; Rodrigues, G. S.; Lima, F. K.; Vatajelu, E. I.; Di Natale, G.; Anghel, L.; Nagarajan, S.; R. Fieback, M. C.; Hamdioui, S. |
| Source: |
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019 IEEE International Symposium on. :8138-8143 Oct, 2019 |
| Relation: |
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| Database: |
IEEE Xplore Digital Library |