| Title: |
A characterization technique of high power/temperature devices using HP4275/3437 systems |
| Authors: |
Mitu, F.; Draghici, F.; Dilimot, G.; Amitroaie, C.; Vladan, I.; Enache, I. |
| Source: |
2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486) Semiconductor conference Semiconductor Conference, 2000. CAS 2000 Proceedings. International. 1:345-348 vol.1 2000 |
| Relation: |
2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings |
| Database: |
IEEE Xplore Digital Library |