| Title: |
Fault Localization Using Dynamic Optical-beam Induced Current Variation Mapping |
| Authors: |
Thor, MH; Goh, SH; Yeoh, BL; Hao, Hu; Chan, YH; Lin, Zhao |
| Source: |
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-8 Jul, 2019 |
| Relation: |
2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| Database: |
IEEE Xplore Digital Library |