| Title: |
Accurate Memory Bitmapping based on Built-in Self-Test: Challenges and Solutions |
| Authors: |
Zhao, Lin; Ngow, YT; Goh, SH; Chan, YH; Hu, Hao; Jeff, F; Tay, CC |
| Source: |
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-8 Jul, 2019 |
| Relation: |
2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| Database: |
IEEE Xplore Digital Library |