Observation of Dynamic VTH of p-GaN Gate HEMTs by Fast Sweeping Characterization
| Title: | Observation of Dynamic VTH of p-GaN Gate HEMTs by Fast Sweeping Characterization |
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| Authors: | Li, X.; Bakeroot, B.; Wu, Z.; Amirifar, N.; You, S.; Posthuma, N.; Zhao, M.; Liang, H.; Groeseneken, G.; Decoutere, S. |
| Source: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(4):577-580 Apr, 2020 |
| Database: | IEEE Xplore Digital Library |