A Highly Reliable Back Side Illuminated Pixel against Plasma Induced Damage
| Title: | A Highly Reliable Back Side Illuminated Pixel against Plasma Induced Damage |
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| Authors: | Sacchettini, Y.; Carrere, J.-P.; Doyen, C.; Duru, R.; Courouble, K.; Ricq, S.; Goiffon, V.; Magnan, P. |
| Source: | 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :16.5.1-16.5.4 Dec, 2019 |
| Relation: | 2019 IEEE International Electron Devices Meeting (IEDM) |
| Database: | IEEE Xplore Digital Library |