| Title: |
27.3 EM and Power SCA-Resilient AES-256 in 65nm CMOS Through >350× Current-Domain Signature Attenuation |
| Authors: |
Das, Debayan; Danial, Josef; Golder, Anupam; Modak, Nirmoy; Maity, Shovan; Chatterjee, Baibhab; Seo, Donghyun; Chang, Muya; Varna, Avinash; Krishnamurthy, Harish; Mathew, Sanu; Ghosh, Santosh; Raychowdhury, Arijit; Sen, Shreyas |
| Source: |
2020 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2020 IEEE International. :424-426 Feb, 2020 |
| Relation: |
2020 IEEE International Solid-State Circuits Conference - (ISSCC) |
| Database: |
IEEE Xplore Digital Library |