| Title: |
Test Structures for Noise Reduction of Fully Depleted-Silicon on Insulator p-Type Tunneling FET Using Channel Orientation |
| Authors: |
Song, Hyun-Dong; Song, Hyeong-Sub; Eadi, Sunil Babu; Choi, Hyun-Woong; Lee, Ga-Won; Lee, Hi-Deok |
| Source: |
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020 |
| Relation: |
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |