Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs
| Title: | Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs |
|---|---|
| Authors: | Ghosh, Amartya; Hao, Jifa; Cook, Michael; Kendrick, Chris; Suliman, Samia A.; Hall, Gavin D.R.; Kopley, Tom; Awadelkarim, Osama O. |
| Source: | 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020 |
| Relation: | 2020 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |