| Title: |
A Reliability Overview of Intel’s 10+ Logic Technology |
| Authors: |
Grover, R.; Acosta, T.; AnDyke, C.; Armagan, E.; Auth, C.; Chugh, S.; Downes, K.; Hattendorf, M.; Jack, N.; Joshi, S.; Kasim, R.; Leatherman, G.; Lee, S.-H.; Lin, C.-Y.; Madhavan, A.; Mao, H.; Lowrie, A.; Martin, G.; McPherson, G.; Nayak, P.; Neale, A.; Nminibapiel, D.; Orr, B.; Palmer, J.; Pelto, C.; Poon, S. S.; Post, I.; Pramanik, T.; Rahman, A.; Ramey, S.; Seifert, N.; Sethi, K.; Schmitz, A.; Wu, H.; Yeoh, A. |
| Source: |
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-6 Apr, 2020 |
| Relation: |
2020 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |