Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging
| Title: | Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging |
|---|---|
| Authors: | Song, Hyeong-Sub; Eadi, Sunil Babu; Song, Hyun-Dong; Choi, Hyun-Woong; Lee, Ga-Won; Lee, Hi-Deok |
| Source: | 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-4 Apr, 2020 |
| Relation: | 2020 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |