A 3-D Simulation-Based Approach to Analyze Heavy Ions-Induced SET on Digital Circuits
| Title: | A 3-D Simulation-Based Approach to Analyze Heavy Ions-Induced SET on Digital Circuits |
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| Authors: | Sterpone, L.; Luoni, F.; Azimi, S.; Du, B. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(9):2034-2041 Sep, 2020 |
| Database: | IEEE Xplore Digital Library |