Slip Ring Test Assembly With Increased Breakdown Voltage Limit for High-Voltage Bus Satellites
| Title: | Slip Ring Test Assembly With Increased Breakdown Voltage Limit for High-Voltage Bus Satellites |
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| Authors: | Avino, F.; Gaffinet, B.; Bommottet, D.; Howling, A.; Furno, I. |
| Source: | IEEE Aerospace and Electronic Systems Magazine IEEE Aerosp. Electron. Syst. Mag. Aerospace and Electronic Systems Magazine, IEEE. 35(8):32-36 Aug, 2020 |
| Database: | IEEE Xplore Digital Library |